VIEW MICROLINE
- 產品概述
The VIEW MicroLine® is a high-performance critical dimensional measurement system designed to measure wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
MicroLine systems feature the highest quality microscope optics, manually operated stages and programmable light intensity. MicroLine systems are robust and capable of measuring transparent layers, lines with irregular edge and other critical features.
- 關於公司
VIEW Micro-Metrology produces high accuracy video coordinate measuring systems for process control metrology. VIEW Micro-Metrology is the combination of Micro-Metric and VIEW Engineering, two technology-leading companies each with over 30 years of experience designing and building the world's best non-contact optical metrology systems that have joined together under Quality Vision International, the world's largest vision metrology company. We offer two families of high-precision systems: our high-speed, high accuracy coordinate metrology systems from VIEW Engineering measure complex components, and our microscopy systems from Micro-Metric measure semiconductor and MEMs wafers, hard disk head sliders and photomasks.