NIKON XT H 225 LC

型号
XT H 225 LC
品牌
类型
控制系统
  • 规格
    控制系统
    数控系统
  • 产品概述

    The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.


    型号说明书 (4.8 MB)

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