FISCHERSCOPE X-RAY XDAL®
- 제품 개요
Features
With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings – due to better signal/noise ratios
Micro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.
Large and spacious measurement chamber with a cutout
(C-slot)
Fast, programmable XY-stage with pop-out function
Typical fields of applicationMaterial analysis of coatings and alloys (also thin coatings and low concentrations)
Incoming goods inspection, manufacturing monitoring
Research and development
Electronics industry
Connectors and contacts
Gold, jewellery and watch industries
Measurement of thin Au and Pd coatings of only a few nanometres in printed circuit board manufacturing
Trace analysis
Determination of lead (Pb) for "high reliability" applications
Analysis of hard material coatings - 회사에 관하여
Fischer is a manufacturer of non-destructive coating thickness measurement, material testing, nanoindentation and material analysis instrumentation including calibration and certification. Measurement methods available from Fischer include X-Ray fluorescence, beta backscatter, magnetic induction, eddy current, and coulometric measurement principles that are incorporated into hand-held and/or bench top models.
대리점와(과) 서비스 및 수리 숖
- 대리점1Helmut Fischer, S. de R.L. de C.V.
Anillo Vial II Junípero Serra No. 2450, Interior 201
Pabellón Corporativo, Valle de Juriquilla II
Querétaro, Queretaro de Arteaga 76230
멕시코 - 서비스 및 수리 숖1