Features

Premium model with universal application characteristics
Highest excitation flexibility, for both the size of the measurement spot and the spectral composition
With the silicon drift detector, even very high intensities
> 100 kcps can be processed without a loss in energy resolution
Very low detection limits and excellent repeatability
Large and easily accessible measurement chamber
Automated series testing with fast, programmable XY-stage
Typical fields of application

Inspection of very thin coatings, e.g. in the electronics and semiconductor industries
Trace analysis, e. g. detection of harmful substances, according to RoHS, toy standards, packaging standards
Gold and precious metal analysis with highest precision
Photovoltaic industry
Measurement of thickness and composition of NiP-layers