FISCHERSCOPE X-RAY XDAL®

  • Product Overview

    Features

    With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings – due to better signal/noise ratios
    Micro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.
    Large and spacious measurement chamber with a cutout
    (C-slot)
    Fast, programmable XY-stage with pop-out function
    Typical fields of application

    Material analysis of coatings and alloys (also thin coatings and low concentrations)
    Incoming goods inspection, manufacturing monitoring
    Research and development
    Electronics industry
    Connectors and contacts
    Gold, jewellery and watch industries
    Measurement of thin Au and Pd coatings of only a few nanometres in printed circuit board manufacturing
    Trace analysis
    Determination of lead (Pb) for "high reliability" applications
    Analysis of hard material coatings


    Model Brochure (215 KB)

  • About Company
    Fischer Technology, Inc.

    Fischer is a manufacturer of non-destructive coating thickness measurement, material testing, nanoindentation and material analysis instrumentation including calibration and certification. Measurement methods available from Fischer include X-Ray fluorescence, beta backscatter, magnetic induction, eddy current, and coulometric measurement principles that are incorporated into hand-held and/or bench top models.


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